Tag: ODU Layer

OTN – Lesson 10 – Video 5N – ODUk_TT_Sk Atomic Function

This post presents the 5th of the 7 Videos that covers training on the Peformance Monitoring of the ODUk Layer (for Non-Multiplexed Applications). This post focuses on the Sink Direction ODU-Layer Atomic Functions. More specifically, this post presents a video that discusses how the ODUk_TT_Sk Atomic Function declares and clears the PM-dDEG defect condition.

OTN – Lesson 10 – Video 5N – The ODUk_TT_Sk Atomic Function

This blog post presents a video that continues our discussion of the ODUk_TT_Sk Atomic Function.  

This video covers the following features within the ODUk_TT_Sk Atomic Function.

  • How the ODUk_TT_Sk function declares and clears the dDEG (Path Signal Degrade) defect condition?
  • What does the ODUk_TT_Sk function do with its AI_TSF Output pin whenever it declares a Service-Affecting defect condition?
  • What does the ODUk_TT_Sk function do with its AI_TSD Output pin whenever it declares the dDEG (Signal Degrade) defect condition?  
  • Defect Correlation Equation Analysis
  • Consequent Equation Analysis 
  • Performance Monitoring Equation Analysis

Continue reading “OTN – Lesson 10 – Video 5N – ODUk_TT_Sk Atomic Function”

OTN – Lesson 10 – Video 4N – More of the ODUk_TT_Sk Atomic Function

This post presents the 4th of the 7 Videos that covers training on the Peformance Monitoring of the ODUk Layer (for Non-Multiplexed Applications). This post focuses on the Sink Direction ODU-Layer Atomic Functions. More specifically, this post includes a video that describes how the ODUk_TT_Sk Atomic Function declares and clears the dTIM, ODUk-AIS, dLCK and dOCI defect conditions.

OTN – Lesson 10 – Video 4N – More of the ODUk_TT_Sk Atomic Function

This blog post includes a video that continues to describe the role/functionality of the ODUk_TT_Sk atomic function. 

In particular, this video explains how the ODUk_TT_Sk function declares and clears the following defect conditions.  

  • dTIM – Trail Trace Identifier Mismatch defect
  • dAIS – ODUk-AIS defect condition
  • dLCK- ODUk-LCK defect condition
  • dOCI – ODUk-OCI defect condition

Continue reading “OTN – Lesson 10 – Video 4N – More of the ODUk_TT_Sk Atomic Function”

OTN – Lesson 10 – Video 3N – The OTUk/ODUk_A_Sk and ODUk_TT_Sk Atomic Functions

This post presents the 3rd of the 7 Videos that covers training on the Peformance Monitoring of the ODUk Layer (for Non-Multiplexed Applications). This post focuses on the Sink Direction ODU-Layer Atomic Functions.

OTN – Lesson 10 – Video 3N – The OTUk/ODUk_A_Sk and ODUk_TT_Sk Atomic Functions

This post contains a video that begins our discussion of the Receive (or Sink) Direction circuitry.  

In particular, this video covers the following Atomic Functions.

  • The OTUk/ODUk_A_Sk Atomic Function, and
  • A portion of the ODUk_TT_Sk Atomic Function.

This video covers the following features associated with the ODUk_TT_Sk Atomic Function.

  • Checking for Near-End Errors (e.g., PM-BIP-8 Errors)
  • Checking for Far-End Error Counts (e.g., PM-BEI)

This video also discusses how the ODUk_TT_Sk function will declare and clear the PM-dBDI (Backward Defect Indicator) defect condition.  

Continue reading “OTN – Lesson 10 – Video 3N – The OTUk/ODUk_A_Sk and ODUk_TT_Sk Atomic Functions”

Defect – Definition

This post presents ITU-T G.806’s definition of a defect or defect condition.

Defect – Definition

ITU-T G.806 defines the word defect as follows:

Defect: The density of anomalies has reached a level where the ability to perform a required function has been interrupted.

We use defects as an input for performance monitoring, controlling consequent actions, and determining fault causes.

In other words, defects are bad.

If some piece of networking equipment is declaring a defect condition, it is saying it “cannot do its job properly” because of this condition.

Defects that We Cover in this Blog

We cover the following defects in this blog.

For OTN Applications

OTU Layer
  • dLOS-P – Loss of Signal – Path
  • dLOS-P[i] – Loss of Signal – Path, Electrical Lane, i
  • dLOFLANE[j] – Loss of Frame – of Logical Lane j
  • dLOR[j] – Loss of Recovery, Logical Lane j
  • dLOL – Loss of Lane Alignment
  • Excessive Skew (OTL3.4 and OTL4.4 Applications)
  • dLOF – Loss of Frame
  • dLOM – Loss of Multi-Frame
  • dAIS – (OTUk-) Alarm Indication Signal
  • dTIM – Trail Trace Identifier Mismatch
  • dBDI – Backward Defect Indicator
  • dDEG – Signal Degrade
  • dIAE – Input Alignment Error
  • dBIAE – Backward Input Alignment Error
ODU Layer
  • dAIS – (ODUk) Alarm Indication Signal
  • dLCK – Locked Status
  • dOCI – Open Connection Indication
  • dTIM – Trail Trace Identifier Mismatch
  • dBDI – Backward Defect Indicator
  • dDEG – Signal Degrade
Non-Multiplexed Applications
  • dLCS – Loss of Character Synchronization (100GBASE-R)
  • dPLM – Payload Type Mismatch
Multiplexed Applications
  • dLOOMFI – Loss of OMFI Synchronization
  • dLOFLOM[p] – Loss of Frame, Loss of Multi-Frame – ODUj Tributary Port p
  • dMSIM[p] – Multiplex Structure Identifier Mismatch – ODUj Tributary Port p
Tandem Connection Monitoring (TCM)
  • TCMi-dAIS – TCM Level i, Alarm Indication Signal
  • TCMi-dLCK – TCM Level i, Locked Status
  • TCMi-dOCI – TCM Level i, Open Connection Indication
  • TCMi-dTIM – TCM Level i, Trail Trace Identifier Mismatch
  • TCMi-dBDI – TCM Level i, Backward Defect Indicator
  • TCMi-dDEG – TCM Level i, Signal Degrade
  • TCMi-dIAE – TCM Level i, Input Alignment Error
  • TCMi-dBIAE – TCM Level i, Backward Input Alignment Error
  • dLTC – Loss of Tandem Connection Monitoring

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